AMMRF -

PHI TRIFT V nanoToF ToF-SIMS
Time-Of-Flight Secondary Ion Mass Spectrometer

Contact

Ian Wark Research Institute, University of South Australia; South Australian Regional Facility (SARF)
Dr John Denman, ToF-SIMS Technologist
Tel: 08 8302 5529
Email: john.denman@unisa.edu.au

Capabilities

A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences.

Benefits :

  • Mass spectra of surface layers of materials and absorbed molecules.
  • Imaging of spatial distributions of mass signals on materials surfaces.
Example images
  ToF-SIMS imaging of a diagnostic microarray surface.

 

   
  Part of the mass spectrum recorded with a sub-monolayer antibacterial coating.

TOP

Flagship instruments

Cameca IMS 1280 Ion Probe
Cameca NanoSIMS 50 Ion Probe
The University of Western Australia

High-throughput cryo-TEM facility
The University of Queensland

Imago Local Electrode Atom Probes
The University of Sydney

FEI Nova NanoLab 200 DualBeam FIB
The University of New South Wales

FEI Helios NanoLab DualBeam FIB
The University of Adelaide; South Australian Regional Facility (SARF)

High-resolution SEM microanalysis facility
The University of New South Wales

PHI TRIFT V nanoToF ToF-SIMS
University of South Australia; South Australian Regional Facility (SARF)