AMMRF -

 

High-Resolution SEM Microanalysis Facility

Contact

Electron Microscope Unit, The University of New South Wales
Prof. Paul Munroe, AMMRF Technical Director
Tel: 02 9385 4435
Email: p.munroe@unsw.edu.au

Capabilities

This is a suite of field-emission scanning-based instruments for high-resolution, chemical and crystallographic analysis including a JEOL 7001F (pictured) with a SDD elemental analyser and EBSD detector and a FEI NanoSEM 230 also with a SDD elemental analyser. The latter instrument operates in low-vacuum mode for the high-resolution analysis of non-conducting specimens. These instruments are ideal for the examination of nano-scale materials and devices.

Example images

High-resolution potassium map for pyrolised chicken litter char.

Titanium dioxide nanoflower.

Resolution improvements achieved with aberration correction.
Image courtesy of JEOL.

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Flagship instruments

Cameca IMS 1280 Ion Probe
Cameca NanoSIMS 50 Ion Probe
The University of Western Australia

High-throughput cryo-TEM facility
The University of Queensland

Imago Local Electrode Atom Probes
The University of Sydney

FEI Nova NanoLab 200 DualBeam FIB
The University of New South Wales

FEI Helios NanoLab DualBeam FIB
The University of Adelaide; South Australian Regional Facility (SARF)

High-resolution SEM microanalysis facility
The University of New South Wales

PHI TRIFT V nanoToF ToF-SIMS
University of South Australia; South Australian Regional Facility (SARF)