Via public and user fora and participation at national and international conferences, the AMMRF leadership has devised a future vision for this Facility that will continue to provide Australian researchers with the state-of-the-art in nanostructural analysis. By considering Australia's current and emerging scientific strengths and research goals, and research and technological
trends overseas, this holistic vision encompasses the needs of the present and future users-community of the Facility. A specific portfolio of new generation nanostructural analysis tools has been selected to meet the current and future demands for advanced characterisation.
Cameca IMS 1280 and NanoSIMS 50 ion probes
|Ion probes for chemical and high-precision isotopic analysis and imaging to the nanoscale
This secondary-ion mass spectrometry facility offers high-sensitivity and high-precision isotoperatio analysis for a diverse array of materials.
Centre for Microscopy, Characterisation and Analysis; The University of Western Australia
|Unique high-throughput cryo-transmission electron microscopy (TEM) facility for structural analysis
This cryo-TEM facility has the latest technologies, including ultrahigh-resolution CCD cameras and specialist cryo-holders, creating a world-class platform for high-throughput structure determination.
Centre for Microscopy and Microanalysis; The University of Queensland
|Local electrode atom probes for atomic-level analysis of materials
This world-leading facility provides comprehensive capabilities in atom probe tomography. Voltage-pulsed atom probe and pulsed-laser atom probe open up this powerful technique to a large variety of applications, from conductive to less-conductive materials.
Australian Centre for Microscopy & Microanalysis; The University of Sydney
|High-resolution scanning electron microscopes with focused ion beams (FIBs), energy dispersive X-ray spectroscopy and electron backscattered diffraction systems
With dual high-resolution electron and ion columns, these advanced microscopes offer a key capability in sub-nanometre-resolution imaging, in high-precision cross-sectioning by ion milling, and in elemental and orientational analysis. They also make possible 3-D image reconstruction by sliceand- view, script-driven large-scale prototype patterning and preparation of thin-foil TEM samples of difficult materials.
Electron Microscope Unit; The University of New South Wales Adelaide Microscopy; The University of Adelaide; South Australian Regional Facility (SARF)
|Unique suite of field-emission scanning electron instruments for materials analysis
This suite of field-emission scanning electron microscopes provides a high-throughput, highprecision facility able to structurally characterise materials and to detect and quantify elements at very high spatial resolution. High-resolution SEM imaging completes this comprehensive imaging and analysis platform.
Electron Microscope Unit; The University of New South Wales
|Time-of-flight secondary ion mass spectrometer (ToF-SIMS) for surface analysis and depth profiling
The PHI TRIFT V nanoToF ToF-SIMS is able to conduct surface analysis at the nanometre level for the identification and mapping of elements and molecules. This instrument is unique in its ability to combine sensitivity, spatial resolution and chemical specificity with parallel detection of atomic and molecular species.
Ian Wark Research Institute; University of South Australia; South Australian Regional Facility (SARF)
All flagship instruments are funded by