AMMRF -

FEI Helios NanoLab DualBeam FIB

Contact

Adelaide Microscopy, The University of Adelaide; South Australian Regional Facility (SARF)
Dr Len Green, DualBeam Engineer
Tel: 08 8303 5855
Email: len.green@adelaide.edu.au

Capabilities

The next-generation focused ion beam / field-emission SEM instrument provides a platform for sub-nanometre resolution imaging with innovative machining capability. The instrument provides leading-edge capability with novel solutions to difficult sample preparation, 2-D and 3-D nanoanalysis and prototyping, and it adds to the nations capacity for this technology.

Applications include micro-machining and analysis of renewable energy 'sliver' technologies, applications for the defence industries, and in the prototype manufacture of laser hydrophones.

Example images
Nanofabrication.
Image courtesy of FEI Company.

TOP

Flagship instruments

Cameca IMS 1280 Ion Probe
Cameca NanoSIMS 50 Ion Probe
The University of Western Australia

High-throughput cryo-TEM facility
The University of Queensland

Imago Local Electrode Atom Probes
The University of Sydney

FEI Nova NanoLab 200 DualBeam FIB
The University of New South Wales

FEI Helios NanoLab DualBeam FIB
The University of Adelaide; South Australian Regional Facility (SARF)

High-resolution SEM microanalysis facility
The University of New South Wales

PHI TRIFT V nanoToF ToF-SIMS
University of South Australia; South Australian Regional Facility (SARF)